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DIRECTED
ENERGY
PROFESSIONAL
SOCIETY
Abstract: 24-Symp-034
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UNCLASSIFIED, PUBLIC RELEASE
The Feasibility of a Direct Injection Probe with a Capacitively Coupled Return and Integrated Voltage Monitor
The feasibility of a direct injection probe with a capacitively coupled return and integrated voltage monitor is studied in this work. This probe is advantageous because it can inject into a target and measure the voltage at the target during the injection. This monitor is key because the voltage at the test node is often not the same as the voltage incident into the probe due to the mismatched impedance of the probe and the test node. The probe is broadband (operating from ~100 MHz to 8 GHz), does not require a galvanic connection between the probe return and the system return, and is mostly non-invasive (only contacting the test system via a non-soldered one-wire connection). This probe is shown to be insensitive to landing variations (error < 2.5 dB) and, with an appropriate inverse-calculation scheme, is able to calculate the nodal voltage on target with an error less than 2.5 dB. Future work is focused on validation of the presented probe in more realistic measurement conditions and implementation of calculation methods to determine the input impedance of the target as well as the injected voltage with a single injection.
This research was developed with funding from the Defense Advanced Research Projects Agency (DARPA). The views, opinions and/or findings expressed are those of the author and should not be interpreted as representing the official views or policies of the Department of Defense or the U.S. Government.
Distribution A: Approved for Public Release
UNCLASSIFIED, PUBLIC RELEASE
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